Auflistung nach Schlagwort "Spectroscopic ellipsometry"

Auflistung nach Schlagwort "Spectroscopic ellipsometry"

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  • Experimental Determination of the Uncertainty of the Absorption Coefficient of Crystalline Silicon 
    Schinke, Carsten; Peest, Peter Christian; Bothe, Karsten; Schmidt, Jan; Brendel, Rolf; Vogt, Malte R.; Kröger, Ingo; Winter, Stefan; Schirmacher, Alfred; Lim, Siew; Nguyen, Hieu T.; MacDonald, Daniel (Amsterdam : Elsevier, 2015)
    Based on a combined analysis of spectroscopic ellipsometry, reflectance and transmittance measurements as well as spectrally resolved luminescence measurements and spectral responsivity measurements, we present data of the ...
  • In situ spectroscopic ellipsometry as a pathway toward achieving VO2stoichiometry for amorphous vanadium oxide with magnetron sputtering 
    Xu, C.; Heinemeyer, F.; Dittrich, A.; Bäumer, C.; Reineke-Koch, R. (New York, NY : American Inst. of Physics, 2021)
    As a special class of materials, transition metal oxides exhibit in their crystalline phase a variety of interesting properties, such as metal-insulator transition, ferroelectricity, magnetism, superconductivity, and so ...
  • Optical Constants of UV Transparent EVA and the Impact on the PV Module Output Power under Realistic Irradiation 
    Vogt, Malte R.; Holst, Hendrik; Schulte-Huxel, Henning; Blankemeyer, Susanne; Witteck, Robert; Hinken, David; Winter, Matthias; Min, Byungsul; Schinke, Carsten; Ahrens, Ingo; Köntges, Marc; Bothe, Karsten; Brendel, Rolf (London : Elsevier Ltd., 2016)
    We measure and discuss the complex refractive index of conventional ethylene vinyl acetate (EVA) and an EVA with enhanced UV-transmission based on spectroscopic ellipsometry, transmission and reflection measurements over ...
  • Parasitic Absorption in Polycrystalline Si-layers for Carrier-selective Front Junctions 
    Reiter, Sina; Koper, Nico; Reineke-Koch, Rolf; Larionova, Yevgeniya; Turcu, Mircea; Krügener, Jan; Tetzlaff, Dominic; Wietler, Tobias; Höhne, Uwe; Kähler, Jan-Dirk; Brendel, Rolf; Peibst, Robby (London : Elsevier Ltd., 2016)
    We investigate the optical properties of n- and p-type polycrystalline silicon (poly-Si) layers. We determine the optical constants n and k of the complex refractive index of polycrystalline silicon by using variable-angle ...